Effect of high temperature on analog parameters of Asymmetric Self-Cascode SOI nMOSFETs

Abstract

This paper presents an analysis on the high temperature operation of Silicon-on-Insulator (SOI) nMOSFETs in Asymmetric Self-Cascode (A-SC) configuration. For this analysis, experimental results in the range of 300K to 500K of A-SC structures with different channel lengths for both the drain side transistor (MD) and source side transistor (MS) are used. The effect of varying channel length under high temperatures on the A-SC association is evaluated using as figure of merit important analog parameters, such as the intrinsic voltage gain and transconductance over drain current ratio.