Measurements of absolute Cu, Zn and Sn metastable densities in CZTS sputtering plasmas measured using UVAS technique

N. Nafarizal, K. Sasaki
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Abstract

In the present study, absolute density of Cu, Zn, and Sn metastable in the discharge phase of magnetron sputtering plasma were evaluated experimentally. Magnetron sputtering plasma system using stoichiometric Cu2ZnSnS4 compound target was produced with pulsed-modulated rf 13.56 MHz power supply. Then, the temporal evolution of atomic metastable density in the afterglow was measured using ultraviolet absorption spectroscopy techniques with hollow cathode lamp (HCL) as light source. The absorption signal decreased very rapidly after the termination of discharge power, indicating that the metastable density decreased rapidly in the afterglow. Therefore, the absolute Cu, Zn, and Sn metastable atom densities in the discharge phase were evaluated just after the termination of rf power. It has been observed that the absolute Cu, Zn, and Sn metastable atom densities in the gas phase were not in agreement with the stoichiometric composition of sputter target and deposited films. In addition, the characteristic of metastable atom densities was consistent with the ground state atom densities. The results suggest a possibility of unconventional sputtering process for compound sputter deposition.
用UVAS技术测量CZTS溅射等离子体中Cu、Zn和Sn的绝对亚稳密度
本文研究了磁控溅射等离子体放电相中Cu、Zn和Sn亚稳的绝对密度。采用脉冲调制射频13.56 MHz电源,制备了化学计量Cu2ZnSnS4复合靶的磁控溅射等离子体系统。然后,以空心阴极灯(HCL)为光源,利用紫外吸收光谱技术测量了余辉中原子亚稳态密度的时间演变。放电功率终止后,吸收信号迅速下降,表明余辉中亚稳密度迅速下降。因此,在射频功率终止后,计算了放电相中Cu、Zn和Sn的绝对亚稳原子密度。结果表明,Cu、Zn和Sn在气相中的亚稳原子密度与溅射靶和沉积膜的化学计量组成不一致。此外,亚稳态原子密度特征与基态原子密度特征一致。结果表明,采用非常规溅射工艺制备复合溅射沉积是可行的。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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