Study of Nanosheet Performance by Varying the Aspect Ratio

Ellapu Bhanu Prakash, R. Dhar
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Abstract

With FETs being scaled continuously, short channel effects can be experienced as a result. The main objective of this paper is to design and analyze the nanosheet GAA FET with equal aspect ratio of width to height and propose a nanosheet devices with reduced width and height by incorporating three nanowires with underlap. Each device is stimulated and its performance is observed. This paper investigates the effect of short channel effects on the performance of nanosheet GAA FETs, with a focus on minimizing SCEs. Short channel effects are observed in these devices and note that some parameters are enhanced. The short channel effects such as subthreshold slope and DIBL is the factors that increase the device’s short channel performance as a result of the observed improvements. In nanosheet GAA FETs, the ON-state current is getting more. In order to achieve a large ON-state current, designing nanowire devices with underlaps on either side of the channel is one of the techniques. Three nanowires are employed to design the nanosheet GAA FET, which consists of bulk and underlapped source/drain regions. The characteristics of all the three devices are investigated and it is seen that the ON-state current is reduced due to decrease of carriers flow from source to drain through the channel in proposed devices and also reduce the OFF-state current which provides the improved short channel performance in proposed devices. By reducing the channel height, the device is proved the better ON current and reducing of device width provides the enhanced short channel performances of nanosheet.
改变宽高比对纳米片性能的研究
由于fet连续缩放,因此可以体验到短通道效应。本文的主要目的是设计和分析具有等宽高比的纳米片GAA场效应管,并提出了一种采用三根带衬垫的纳米线来减小宽度和高度的纳米片器件。每个设备都进行了刺激,并观察了其性能。本文研究了短通道效应对纳米片GAA场效应管性能的影响,重点是最小化ses。在这些器件中观察到短通道效应,并注意到一些参数被增强。由于观察到的改进,诸如阈下斜率和DIBL等短通道效应是增加器件短通道性能的因素。在纳米片GAA场效应管中,导通电流越来越大。为了获得大的导通电流,设计在通道两侧都有underlaps的纳米线器件是技术之一。采用三根纳米线设计了纳米片GAA场效应晶体管,该晶体管由块状和重叠的源/漏区组成。对这三种器件的特性进行了研究,发现由于在所提出器件中载流子从源极流到漏极流的减少,导通状态电流减小,并且关闭状态电流减小,从而改善了所提出器件的短通道性能。通过减小通道高度,证明了该器件具有更好的导通电流,减小器件宽度可提高纳米片的短通道性能。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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