A. Rennane, L. Bary, G. Niu, J. Cressler, J. Joseph, J. Graffeuil, R. Plana
{"title":"Scaleable non linear low frequency noise model of SiGe HBT","authors":"A. Rennane, L. Bary, G. Niu, J. Cressler, J. Joseph, J. Graffeuil, R. Plana","doi":"10.1109/SMIC.2003.1196702","DOIUrl":null,"url":null,"abstract":"This paper presents the low frequency noise behavior of advanced SiGe HBT's. It is investigated the influence of the Ge rate on the low frequency noise properties. We propose a scaleable non linear model that is compatible with commercial CAD platform.","PeriodicalId":332696,"journal":{"name":"2003 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, 2003. Digest of Papers.","volume":"92 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2003-04-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2003 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, 2003. Digest of Papers.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SMIC.2003.1196702","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
This paper presents the low frequency noise behavior of advanced SiGe HBT's. It is investigated the influence of the Ge rate on the low frequency noise properties. We propose a scaleable non linear model that is compatible with commercial CAD platform.