Predicting vibration-induced fretting in land grid array sockets in simulated field scenarios

K. Meyyappan, Qifeng Wu, V. Vasudevan, M. Vujosevic
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引用次数: 3

Abstract

Electrical contacts provide means for a separable connection between two current carrying conductors. Sockets containing these contacts could be exposed to mechanical vibration due to shipping, which can result in micromotion between mating surfaces. Repeated micromotion/fretting could lead to wearout of the protective gold layer and expose the base metal that can oxidize. Traditional laboratory based fretting experiments may not reflect the field reliability risks. In this study, a predictive capability is developed to investigate contact fretting in a socket due to random vibration using a finite element approach. Considering the degrees of freedom involved in the analysis and the resolution needed, a multiscale modeling approach utilizing global models with substructures to track high risk areas and local models to monitor fretting wear on the highest risk contact is employed. This approach allowed the study of micromotion at the contact interface, capturing stick-slip phenomenon, which can influence fretting wear. Predictions are validated through extensive experimentation, which includes matching of fretting risk areas, matching dynamic responses, and matching of fretting wipe lengths and location through image processing techniques.
模拟现场场景下地网阵列插座振动诱发微动预测
电触点为两个载流导体之间的可分离连接提供了手段。包含这些触点的插座可能由于运输而暴露在机械振动中,这可能导致配合表面之间的微运动。反复的微动/微动可能会导致保护金层的磨损,并暴露可能氧化的贱金属。传统的基于实验室的微动试验可能无法反映现场可靠性风险。在这项研究中,利用有限元方法开发了一种预测能力来研究由于随机振动引起的插座接触微动。考虑到分析所涉及的自由度和所需的分辨率,采用了一种多尺度建模方法,利用带子结构的全局模型跟踪高风险区域,利用局部模型监测最高风险接触处的微动磨损。这种方法可以研究接触界面的微运动,捕捉影响微动磨损的粘滑现象。预测通过广泛的实验得到验证,其中包括通过图像处理技术匹配微动风险区域,匹配动态响应以及匹配微动擦拭长度和位置。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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