Hot tear cracks on the suppression of Sn–Bi alloy for low-temperature assembly

Songtao Qu, Q. Shi
{"title":"Hot tear cracks on the suppression of Sn–Bi alloy for low-temperature assembly","authors":"Songtao Qu, Q. Shi","doi":"10.1108/ssmt-01-2023-0003","DOIUrl":null,"url":null,"abstract":"\nPurpose\nIn the electronic assembly industry, low-temperature soldering holds great potential to be used in surface mounting technology. Tin–bismuth (Sn–Bi) eutectic alloys are lead-free solders applied in consumer electronics because of their low melting point, high strength and low cost. This paper aims to investigate how to address the problem of hot tear crack formation during Sn–Bi low-temperature solder (LTS) in the mass production of consumer electronics.\n\n\nDesign/methodology/approach\nThis paper explored the development of hot tear cracks during Sn–Bi soldering in the fabrication of flip chip ball grid arrays. Experiments were designed to simulate various conditions encountered in Sn–Bi soldering. Quantitative analysis was conducted on the number of hot tear cracks observed in different alloy compositions and solder volumes to explore the primary cause of hot tear cracks and possible methods to suppress crack formation.\n\n\nFindings\nHot tear cracks existed in Sn–Bi solders with different bismuth (Bi) contents, but increasing the solder volume reduced the number of hot tear cracks. Experiments were designed to test the degree of chip transient thermal warpage with temperature change, and, according to the results, glue was dispensed in specific areas to reduce chip warpage deformation. Finally, the results of combined process experiments pointed to an effective method of low-temperature soldering to suppress hot tear cracks.\n\n\nResearch limitations/implications\nThe study focuses on Sn–Bi solders only without other solder pastes such as SAC305 or Sn–Zn series.\n\n\nPractical implications\nWith the growing popularity of smart electronics, especially in intelligent terminals, new energy vehicles electronics, solar photovoltaic and other field, there will be more and more demand for low- temperature, energy-saving, lead-free solders. Therefore, this study will help the industry to roll out LTS (Sn–Bi) solutions rapidly.\n\n\nSocial implications\nIn the long term, lean and green manufacturing is expected to be essential for maintaining an advanced manufacturing industry across the world. Developing new LTSs and soldering processes is the most effective, direct solution for energy conservation and emission mitigation. With the growing popularity of smart electronics, especially in intelligent terminals, new energy vehicles and solar photovoltaics, there would be an increased demand for low-temperature, energy-saving, lead-free techniques.\n\n\nOriginality/value\nAlthough there are many methods that can be used to suppress hot tear cracks, there is little research on how to control the hot tear cracks caused by the low-temperature soldering of Sn–Bi in laptop applications. The authors studied the hot tear cracks that developed during the world’s first mass production of 50 million personal laptops based on low-temperature Sn–Bi alloy solder pastes. By controlling the Bi content, redesigning the solder paste printing process (e.g. through a printer’s stencil) and adding dispensing processes, the authors obtained reliable and stable experimental data and conclusions.\n","PeriodicalId":382949,"journal":{"name":"Soldering & Surface Mount Technology","volume":"60 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2023-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Soldering & Surface Mount Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1108/ssmt-01-2023-0003","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0

Abstract

Purpose In the electronic assembly industry, low-temperature soldering holds great potential to be used in surface mounting technology. Tin–bismuth (Sn–Bi) eutectic alloys are lead-free solders applied in consumer electronics because of their low melting point, high strength and low cost. This paper aims to investigate how to address the problem of hot tear crack formation during Sn–Bi low-temperature solder (LTS) in the mass production of consumer electronics. Design/methodology/approach This paper explored the development of hot tear cracks during Sn–Bi soldering in the fabrication of flip chip ball grid arrays. Experiments were designed to simulate various conditions encountered in Sn–Bi soldering. Quantitative analysis was conducted on the number of hot tear cracks observed in different alloy compositions and solder volumes to explore the primary cause of hot tear cracks and possible methods to suppress crack formation. Findings Hot tear cracks existed in Sn–Bi solders with different bismuth (Bi) contents, but increasing the solder volume reduced the number of hot tear cracks. Experiments were designed to test the degree of chip transient thermal warpage with temperature change, and, according to the results, glue was dispensed in specific areas to reduce chip warpage deformation. Finally, the results of combined process experiments pointed to an effective method of low-temperature soldering to suppress hot tear cracks. Research limitations/implications The study focuses on Sn–Bi solders only without other solder pastes such as SAC305 or Sn–Zn series. Practical implications With the growing popularity of smart electronics, especially in intelligent terminals, new energy vehicles electronics, solar photovoltaic and other field, there will be more and more demand for low- temperature, energy-saving, lead-free solders. Therefore, this study will help the industry to roll out LTS (Sn–Bi) solutions rapidly. Social implications In the long term, lean and green manufacturing is expected to be essential for maintaining an advanced manufacturing industry across the world. Developing new LTSs and soldering processes is the most effective, direct solution for energy conservation and emission mitigation. With the growing popularity of smart electronics, especially in intelligent terminals, new energy vehicles and solar photovoltaics, there would be an increased demand for low-temperature, energy-saving, lead-free techniques. Originality/value Although there are many methods that can be used to suppress hot tear cracks, there is little research on how to control the hot tear cracks caused by the low-temperature soldering of Sn–Bi in laptop applications. The authors studied the hot tear cracks that developed during the world’s first mass production of 50 million personal laptops based on low-temperature Sn–Bi alloy solder pastes. By controlling the Bi content, redesigning the solder paste printing process (e.g. through a printer’s stencil) and adding dispensing processes, the authors obtained reliable and stable experimental data and conclusions.
低温装配中抑制锡铋合金热撕裂裂纹的研究
目的在电子组装工业中,低温焊接在表面贴装技术中具有很大的应用潜力。锡铋共晶合金具有熔点低、强度高、成本低等优点,是消费类电子产品中广泛应用的无铅焊料。本文旨在研究如何解决消费电子产品大规模生产中Sn-Bi低温焊料(LTS)产生热撕裂裂纹的问题。设计/方法/方法本文探讨了在倒装芯片球栅阵列制造中锡铋焊接过程中热撕裂裂纹的发展。实验模拟了锡铋焊接过程中遇到的各种条件。对不同合金成分和焊料体积下观察到的热撕裂裂纹数量进行定量分析,探讨热撕裂裂纹产生的主要原因和抑制裂纹形成的可能方法。发现不同铋含量的Sn-Bi钎料均存在热撕裂裂纹,但增加焊料体积可减少热撕裂裂纹的数量。设计实验,测试切屑随温度变化的瞬态热翘曲程度,根据实验结果,在特定区域涂胶,减少切屑翘曲变形。最后,结合工艺试验结果,提出了一种有效抑制热撕裂裂纹的低温焊接方法。研究局限/启示本研究仅关注Sn-Bi焊料,而没有其他焊料膏如SAC305或Sn-Zn系列。随着智能电子产品的日益普及,特别是在智能终端、新能源汽车电子、太阳能光伏等领域,对低温、节能、无铅焊料的需求将越来越大。因此,这项研究将有助于行业快速推出LTS (Sn-Bi)解决方案。从长远来看,精益和绿色制造有望成为维持全球先进制造业的必要条件。开发新的LTSs和焊接工艺是节能减排最有效、最直接的解决方案。随着智能电子产品的日益普及,特别是在智能终端、新能源汽车和太阳能光伏等领域,对低温、节能、无铅技术的需求将会增加。虽然有很多方法可以抑制热撕裂裂纹,但如何控制笔记本电脑应用中Sn-Bi低温焊接引起的热撕裂裂纹的研究很少。作者研究了世界上第一次大规模生产5000万台个人笔记本电脑时,基于低温锡铋合金焊料膏的热撕裂裂纹。通过控制Bi含量,重新设计锡膏印刷工艺(例如通过打印机的模板)和添加点胶工艺,作者获得了可靠和稳定的实验数据和结论。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术官方微信