Fault Attack Detection in AES by Monitoring Power Side-Channel Statistics

A. Shylendra, Priyesh Shukla, S. Bhunia, A. Trivedi
{"title":"Fault Attack Detection in AES by Monitoring Power Side-Channel Statistics","authors":"A. Shylendra, Priyesh Shukla, S. Bhunia, A. Trivedi","doi":"10.1109/ISQED48828.2020.9136981","DOIUrl":null,"url":null,"abstract":"Differential Fault Analysis (DFA) is a cryptoanalysis technique to extract internal state of crypto-algorithms by inducing and propagating the faults during encryption. In this work, we present a low-power CMOS based mixed-signal framework for on-line DFA-based clock-glitch attack detection by monitoring power side-channel statistics. We discuss non-parametric kernel density estimation (KDE)-based technique to develop statistical model of power side-channel leakage. Clock-glitch attack is detected by identifying the low-likelihood samples using the developed statistical model. We have implemented KDE using CMOS current-mode Gilbert Gaussian Circuit-based Gaussian kernels. AES-128 was implemented on ARM Microcontroller by ST Microelectronics and Chip Whisperer-lite board was used to launch clock-glitch attack as well as capture power side-channel traces. We have evaluated the performance of our approach using power side-channel trace with clock-glitch attacks. We have adopted sliding window approach to update the statistical model in real-time. Discussed CMOS-based mixed-signal framework was designed at 45nm technology node and proposed design on an average consumes $\\sim\\mathbf{210}\\mu\\mathbf{W}$ at 2 MHz sampling frequency while utilizing 10 recently validated samples for PDF estimation. Moreover, discussed approach allows programming of parameters such as kernel standard deviation $(Kernel_{SD})$ and likelihood-threshold $(LH_{Thres})$ for high efficiency detection.","PeriodicalId":225828,"journal":{"name":"2020 21st International Symposium on Quality Electronic Design (ISQED)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 21st International Symposium on Quality Electronic Design (ISQED)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED48828.2020.9136981","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2

Abstract

Differential Fault Analysis (DFA) is a cryptoanalysis technique to extract internal state of crypto-algorithms by inducing and propagating the faults during encryption. In this work, we present a low-power CMOS based mixed-signal framework for on-line DFA-based clock-glitch attack detection by monitoring power side-channel statistics. We discuss non-parametric kernel density estimation (KDE)-based technique to develop statistical model of power side-channel leakage. Clock-glitch attack is detected by identifying the low-likelihood samples using the developed statistical model. We have implemented KDE using CMOS current-mode Gilbert Gaussian Circuit-based Gaussian kernels. AES-128 was implemented on ARM Microcontroller by ST Microelectronics and Chip Whisperer-lite board was used to launch clock-glitch attack as well as capture power side-channel traces. We have evaluated the performance of our approach using power side-channel trace with clock-glitch attacks. We have adopted sliding window approach to update the statistical model in real-time. Discussed CMOS-based mixed-signal framework was designed at 45nm technology node and proposed design on an average consumes $\sim\mathbf{210}\mu\mathbf{W}$ at 2 MHz sampling frequency while utilizing 10 recently validated samples for PDF estimation. Moreover, discussed approach allows programming of parameters such as kernel standard deviation $(Kernel_{SD})$ and likelihood-threshold $(LH_{Thres})$ for high efficiency detection.
基于功率侧信道统计的AES故障攻击检测
差分故障分析(DFA)是一种通过诱导和传播加密过程中的故障来提取加密算法内部状态的密码分析技术。在这项工作中,我们提出了一个基于低功耗CMOS的混合信号框架,通过监测功率侧信道统计数据来在线检测基于dfa的时钟故障攻击。讨论了基于非参数核密度估计(KDE)的功率侧通道泄漏统计模型的建立。利用开发的统计模型,通过识别低似然样本来检测时钟故障攻击。我们使用基于CMOS电流模吉尔伯特高斯电路的高斯内核实现了KDE。AES-128由意法半导体在ARM微控制器上实现,芯片Whisperer-lite板用于发动时钟故障攻击和捕获电源侧通道走线。我们已经使用带时钟故障攻击的功率侧信道跟踪评估了我们的方法的性能。我们采用滑动窗口的方法实时更新统计模型。所讨论的基于cmos的混合信号框架在45纳米技术节点上设计,并提出了在2 MHz采样频率下平均消耗$\sim\mathbf{210}\mu\mathbf{W}$的设计,同时利用10个最近验证的样本进行PDF估计。此外,所讨论的方法允许对核标准差$(Kernel_{SD})$和似然阈值$(LH_{Thres})$等参数进行编程,以实现高效检测。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 求助全文
来源期刊
自引率
0.00%
发文量
0
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
确定
请完成安全验证×
copy
已复制链接
快去分享给好友吧!
我知道了
右上角分享
点击右上角分享
0
联系我们:info@booksci.cn Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。 Copyright © 2023 布克学术 All rights reserved.
京ICP备2023020795号-1
ghs 京公网安备 11010802042870号
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术官方微信