On automatic software-based self-test program generation based on high-level decision diagrams

Abstract

Software-Based Self-Testing (SBST) is a well-known non-intrusive method for testing microprocessors. This paper presents an approach for automatic SBST program generation, based on the methodology of using High-Level Decision Diagrams (HLDD) for modeling microprocessors and faults. The novelty of this approach is that Instruction Set Architecture (ISA) of the processor is the only needed input data for the automated test program generator.