A. Malaoui, E. Bendada, M. Mabrouki, M. Ankrim, K. Quotb
{"title":"A new approach of a precise electric modeling of the semiconductors and dielectrics","authors":"A. Malaoui, E. Bendada, M. Mabrouki, M. Ankrim, K. Quotb","doi":"10.1109/ICM.2009.5418644","DOIUrl":null,"url":null,"abstract":"A new method is developed in this work, to seek precise and simple electric models of physical samples. This technique is based on the decomposition of the electric impedance in a series of the elementary electrical circuits. Algorithm and software programs are developed to estimate the order and the number of these basic circuits. Tests are applied on a BST ceramics and Schottky junction. The founding electric models are compared with other models, often used in the literature. Interesting results are observed on the level of the statistical errors and the various significant elements of the models.","PeriodicalId":391668,"journal":{"name":"2009 International Conference on Microelectronics - ICM","volume":"130 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 International Conference on Microelectronics - ICM","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICM.2009.5418644","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
A new method is developed in this work, to seek precise and simple electric models of physical samples. This technique is based on the decomposition of the electric impedance in a series of the elementary electrical circuits. Algorithm and software programs are developed to estimate the order and the number of these basic circuits. Tests are applied on a BST ceramics and Schottky junction. The founding electric models are compared with other models, often used in the literature. Interesting results are observed on the level of the statistical errors and the various significant elements of the models.