High-frequency characterization and simulation of conductor loss in printable electronics technology

2007 IEEE Electrical Performance of Electronic Packaging Pub Date : 2007-11-21 DOI:10.1109/EPEP.2007.4387165

V. Pynttari, R. Makinen, J. Lilja, V. Pekkanen, M. Mantysalo, P. Mansikkamaki, M. Kivikoski

引用次数: 5

Abstract

The conductor loss of very thin lossy printed silver nanoparticle traces manufactured using the printable electronics technology is characterized up to 10 GHz by simulations and measurements. Microstrip resonators are used as test structures.

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可印刷电子技术中导体损耗的高频特性与仿真

通过模拟和测量，采用可印刷电子技术制造的极薄有损耗印刷银纳米粒子线的导体损耗高达10 GHz。微带谐振器作为测试结构。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2007 IEEE Electrical Performance of Electronic Packaging

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