Naoto Yonemoto, Katsuya Nakabai, Y. Uwate, Y. Nishio
{"title":"Investigation of Synchronization Phenomena in Coupled Two-degrees-of-Freedom Chaotic Circuits","authors":"Naoto Yonemoto, Katsuya Nakabai, Y. Uwate, Y. Nishio","doi":"10.1109/ISOCC50952.2020.9333050","DOIUrl":null,"url":null,"abstract":"This paper considers synchronization phenomena in coupled two-degrees-of-freedom chaotic circuits by a resister. It is considered that studying various cases of synchronization phenomena when using chaotic circuits showing asynchronous simultaneous oscillation will be useful in clarifying non-linear phenomena that exist around us. By means of the circuit experiments and computer simulations, chaotic attractors and Lissajous figures are shown. From the results, synchronization phenomenon was confirmed between the circuits farthest from the connection part.","PeriodicalId":270577,"journal":{"name":"2020 International SoC Design Conference (ISOCC)","volume":"133 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 International SoC Design Conference (ISOCC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISOCC50952.2020.9333050","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper considers synchronization phenomena in coupled two-degrees-of-freedom chaotic circuits by a resister. It is considered that studying various cases of synchronization phenomena when using chaotic circuits showing asynchronous simultaneous oscillation will be useful in clarifying non-linear phenomena that exist around us. By means of the circuit experiments and computer simulations, chaotic attractors and Lissajous figures are shown. From the results, synchronization phenomenon was confirmed between the circuits farthest from the connection part.