A reliable and environmentally friendly packaging technology-flip chip joining using anisotropically conductive adhesive

A. Tolvgård, J. Malmodin, Johan Liu, Z. Lai
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引用次数: 48

Abstract

There is increasing demand to move radio base stations closer to the antenna for future mobile telecommunication systems, which requires significant reduction in weight, volume and environmental compatibility. In this work, an evaluation of environmental impact and reliability when using anisotropically conductive adhesives (ACA) for flip-chip joining in radio base station applications has been performed. Conventional FR-4 substrates were used to assemble a digital ASIC chip using an anisotropically conductive adhesive and flip-chip technology. The chip has a minimum pitch of 128 /spl mu/m with a chip size of 7.76 mm and has a total of 216 bumps with bump size of 108/spl times/120 /spl mu/m using electroless nickel/gold bumping technology. The bonding quality was characterized by optical and scanning electron microscopy and substrate planarity measurement. Main quality-affecting parameters are misalignment and softening of the FR-4 substrate during assembly, which lead to high joint resistance. Reliability testing was conducted in a temperature cycling test between -40 and +125/spl deg/C for 1000 cycles, a 125/spl deg/C aging test for 1000 hours and a humidity test 85/spl deg/C/85% RH, 500 hours. The results show that relatively small resistance change was observed after reliability testing. The environmental impact evaluation was conducted as a material content declaration and as a life cycle assessment (LCA). By using flip-chip ACA joining technology, the environmentally hazardous materials content was reduced more than ten times and the use of precious metals was reduced by more than 30 times compared to conventional SMT.
一种可靠且环保的封装技术——使用各向异性导电粘合剂的倒装芯片连接
为了未来的移动电信系统,越来越多的人要求将无线电基站移近天线,这就需要大大减少重量、体积和环境兼容性。在这项工作中,对无线基站应用中使用各向异性导电粘合剂(ACA)进行倒装芯片连接时的环境影响和可靠性进行了评估。采用各向异性导电胶粘剂和倒装芯片技术,在传统FR-4衬底上组装数字ASIC芯片。该芯片最小间距为128 /spl mu/m,芯片尺寸为7.76 mm,采用化学镍/金碰撞技术,共有216个凸起,凸起尺寸为108/spl次/120 /spl mu/m。通过光学显微镜、扫描电镜和衬底平面度测量对键合质量进行了表征。影响质量的主要参数是FR-4基板在装配过程中的错位和软化,导致接头阻力大。在-40 ~ +125℃的温度循环试验中进行了1000次的可靠性测试,在125℃的老化试验中进行了1000小时的可靠性测试,在85℃的湿度试验中进行了500小时的可靠性测试。结果表明,经可靠性测试后,电阻变化较小。环境影响评价作为物质内容声明和生命周期评价(LCA)进行。通过采用倒装ACA连接技术,与传统SMT相比,对环境有害物质的含量减少了10倍以上,贵金属的使用量减少了30倍以上。
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