On-wafer measurement setups for on-chip antennas fabricated on silicon substrates

Jau-Jr Lin, A. Sugavanam, L. Gao, J. Brewer, K. O
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引用次数: 9

Abstract

The paper presents the measurement setups of on-chip antennas for short range communications over free space (/spl mu/Node applications). To evaluate the on-chip antenna characteristics in realistic indoor and outdoor operating environments, two mobile microwave probe stands have been constructed using Delrin (a type of plastic, /spl epsiv//sub r/ /spl sim/3.7). Each stand is equipped with a probe holder and a cable connection to a test instrument. The stands can be connected to a network analyzer for 1-port or 2-port S-parameter measurements. By connecting a spectrum analyzer and a signal generator to these mobile probe stands, power gains between a pair of antennas as a function of separation can be measured. Simulation and measurement results suggest that the effects of probe stands on antenna characteristics are small.
在硅衬底上制造的片上天线的片上测量装置
本文介绍了用于自由空间(/spl mu/Node应用)短距离通信的片上天线的测量装置。为了评估片上天线在真实的室内和室外操作环境中的特性,使用Delrin(一种塑料,/spl epsiv//sub // spl sim/3.7)构建了两个移动微波探针架。每个支架都配有探针支架和连接到测试仪器的电缆。这些支架可以连接到网络分析仪进行1端口或2端口s参数测量。通过将频谱分析仪和信号发生器连接到这些移动探针架,可以测量一对天线之间的功率增益作为分离的函数。仿真和测量结果表明,探头位置对天线特性的影响很小。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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