A. Zarate-de Landa, J. Reynoso‐Hernández, P. Roblin, M. Pulido-Gaytán, J. R. Monjardin-Lopez, J. R. Loo-Yau
{"title":"On the determination of neural network based non-linear constitutive relations for quasi-static GaN FET models","authors":"A. Zarate-de Landa, J. Reynoso‐Hernández, P. Roblin, M. Pulido-Gaytán, J. R. Monjardin-Lopez, J. R. Loo-Yau","doi":"10.1109/ARFTG-2.2013.6737341","DOIUrl":null,"url":null,"abstract":"By using a neural network approach that takes into account input/output relationship data along with derivative information in the training process, a fast and straightforward methodology to obtain the quasi-static model of GaN FETs is introduced. This method uses data obtained from pulsed I/V and S-parameter measurements to train three different neural networks which model the drain current, as well as the gate and drain charge functions. The ANN-based model is implemented in Agilent's ADS™ and validated by comparing the results to measured data.","PeriodicalId":290319,"journal":{"name":"82nd ARFTG Microwave Measurement Conference","volume":"13 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2013-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"82nd ARFTG Microwave Measurement Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ARFTG-2.2013.6737341","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
By using a neural network approach that takes into account input/output relationship data along with derivative information in the training process, a fast and straightforward methodology to obtain the quasi-static model of GaN FETs is introduced. This method uses data obtained from pulsed I/V and S-parameter measurements to train three different neural networks which model the drain current, as well as the gate and drain charge functions. The ANN-based model is implemented in Agilent's ADS™ and validated by comparing the results to measured data.