Compact Modeling of Body Effect for “Extrinsic” MOSFETs

V. Turin, M. Shcherbina, R. Shkarlat, O. Kshensky, V. Poyarkov, G. Zebrev, S. Kokin, S. Makarov, B. Rakhmatov
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Abstract

One of the MOSFET compact modeling challenges is a correct account of the finite output resistance in saturation due to different short channel effects. Previously, we proposed a new “improved” smoothing function that ensures a monotonic increase in output resistance from the minimum value at the beginning of the triode regime to the maximum value at saturation. We used this smoothing function for compact modeling of an “ intrinsic” (with neglecting the contacts parasitic resistances) MOSFET. Later, we proposed a linear approximation for the drain current dependence on drain bias in the saturation regime for the “extrinsic” (taking into account contact parasitic resistances) MOSFET without taking into account body effect. This approximation is based on the proposed by us equations for the output resistance of the “extrinsic” MOSFET in the saturation regime (one for Level l and second for BSIM3 /4 models). Later, we generalized this equation on the case with accounting for the body effect, that was considered in the linear approximation. Note that modern transistors with steep retrograde body doping profiles exhibit approximately linear relationship between a threshold voltage and a source-to-body bias. In addition, we have shown how it is possible to convert a transistor with a body terminal to an equivalent transistor without a body terminal. In this paper, we use an “improved” smoothing function for compact modeling of the drain current of an “extrinsic” MOSFET operating in the above threshold regime that accounts for the body effect in the linear approximation. The resulting model yields a monotonic decrease in output conductance, which is important for improving the accuracy of MOSFET compact modeling in CAD software. Furthermore, we analyze in detail the relationship between the equation obtained for the output resistance of the “extrinsic” MOSFET in the saturation regime with the output resistance of a common-source amplifier with source degeneration. Note that in the theory of a common-source amplifier the circuit that consists of an NMOS transistor with a resistor in series with its source terminal is known as a transistor with source degeneration.
“外源”mosfet体效应的紧凑建模
MOSFET紧凑建模的挑战之一是正确计算由于不同短通道效应而导致的饱和有限输出电阻。之前,我们提出了一个新的“改进”平滑函数,确保输出电阻从三极管状态开始时的最小值单调地增加到饱和时的最大值。我们使用这个平滑函数对一个“固有”(忽略触点寄生电阻)MOSFET进行紧凑建模。后来,我们提出了一个线性近似的漏极电流依赖于漏极偏置在饱和状态下的“外在”(考虑接触寄生电阻)MOSFET,而不考虑体效应。这个近似是基于饱和状态下“外在”MOSFET输出电阻的方程(一个用于电平1,第二个用于BSIM3 /4模型)。随后,我们将该方程推广到考虑了线性近似中所考虑的体效应的情况。请注意,具有陡峭逆行体掺杂曲线的现代晶体管在阈值电压和源体偏置之间表现出近似线性关系。此外,我们还展示了如何将具有本体端子的晶体管转换为没有本体端子的等效晶体管。在本文中,我们使用“改进的”平滑函数对在上述阈值范围内工作的“外在”MOSFET的漏极电流进行紧凑建模,该模型考虑了线性近似中的体效应。由此产生的模型输出电导单调下降,这对于提高CAD软件中MOSFET紧凑建模的精度很重要。此外,我们还详细分析了饱和状态下“外在”MOSFET的输出电阻方程与源退化的共源放大器输出电阻之间的关系。请注意,在共源放大器理论中,由NMOS晶体管及其源端串联电阻组成的电路被称为源退化晶体管。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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