Case study of process and design performance debugging with Digital Speed Sensor

Chao-Wen Tzeng, Ying-Yen Chen, Jih-Nung Lee, Shu-Yi Kao
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Abstract

Using speed sensor to find out the unexpected process variation and design performance degradation is getting more and more attention. In this paper, we demonstrate the industrial case of identifying process variation, with the power of in-house developed DSS (Digital Speed Sensor). The identification result is validated by TEM (Transmission Electron Microscopy). In addition, by using DSS, we can observe how the test environment results in design performance degradation, not only during the CP (Circuit Probe) test but also the board-level test.
数字式速度传感器的工艺及设计性能调试实例研究
利用速度传感器发现非预期的工艺变化和设计性能下降问题越来越受到人们的重视。在本文中,我们展示了识别过程变化的工业案例,利用内部开发的DSS(数字速度传感器)的力量。用透射电镜对鉴定结果进行了验证。此外,通过使用DSS,我们可以观察到测试环境如何导致设计性能下降,不仅在CP(电路探头)测试期间,而且在板级测试期间。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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