Neutron Induced Displacement Damage in Commercial Power Management Integrated Circuits

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC) Pub Date : 2022-07-01 DOI:10.1109/REDW56037.2022.9921647

Gauri Koli, E. Auden, H. Quinn

引用次数: 0

Abstract

Atmospheric neutrons can produce damaging effects in power management integrated circuits (PMICs). Three commercial PMICs have been irradiated with neutrons to investigate displacement damage effects in low drop-out (LDO) and step-down (Buck) voltage regulators.

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商用电源管理集成电路中的中子诱发位移损伤

大气中子可以对电源管理集成电路(pmic)产生破坏性影响。用中子辐照了三个商用pmic，以研究低降差(LDO)和降压(Buck)稳压器中的位移损伤效应。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2022 IEEE Radiation Effects Data Workshop (REDW) (in conjunction with 2022 NSREC)

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