{"title":"Design on ESD protection circuit with very low and constant input capacitance","authors":"Tung-Yang Chen, M. Ker","doi":"10.1109/ISQED.2001.915233","DOIUrl":null,"url":null,"abstract":"Effective on-chip ESD design to solve the ESD protection challenge on the analog pins for high-frequency or current-mode applications is studied. The device dimension of ESD clamp devices in analog ESD protection circuit can be reduced to have a much small input capacitance for high-frequency applications, but it can still sustain a high HBM and MM ESD level. To find the optimized device dimensions and layout spacings on ESD clamp devices, a design model is developed to keep the input capacitance as constant as possible (within 1% variation).","PeriodicalId":110117,"journal":{"name":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","volume":"289 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2001-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"7","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the IEEE 2001. 2nd International Symposium on Quality Electronic Design","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISQED.2001.915233","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 7
Abstract
Effective on-chip ESD design to solve the ESD protection challenge on the analog pins for high-frequency or current-mode applications is studied. The device dimension of ESD clamp devices in analog ESD protection circuit can be reduced to have a much small input capacitance for high-frequency applications, but it can still sustain a high HBM and MM ESD level. To find the optimized device dimensions and layout spacings on ESD clamp devices, a design model is developed to keep the input capacitance as constant as possible (within 1% variation).