The SEU in pulse width modulation controllers with soft start and shutdown circuits

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference Pub Date : 1997-07-24 DOI:10.1109/REDW.1997.629801

S. Penzin, W. Crain, K. Crawford, S. Hansel, R. Koga

引用次数: 22

Abstract

A study was done of Single Event Upset (SEU) in pulse width modulation (PWM) controllers which feature either soft start or shutdown circuits. Upsets occurring in the soft start circuit of these devices may greatly effect the external circuit depending on the configuration of the PWM.

查看原文本刊更多论文

带软启动和软关闭电路的脉宽调制控制器中的SEU

对脉冲宽度调制(PWM)控制器中的单事件干扰(SEU)进行了研究，该控制器具有软启动或软关闭电路。在这些器件的软启动电路中发生的异常可能会极大地影响外部电路，这取决于PWM的配置。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

求助全文

约1分钟内获得全文求助全文

来源期刊

1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference

自引率

0.00%

发文量