Dataline Isolated Differential Current Feed/Mode Sense Amplifier for Small Icell SRAM Using FinFET

B. Reniwal, V. Vijayvargiya, Pooran Singh, S. Vishvakarma, D. Dwivedi
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引用次数: 5

Abstract

This paper for the first time presents a novel, high-performance and robust current feed sense amplifiers (CF-SA) design for small ICell SRAM in 20nm Fin-shaped field effect transistor (FinFET) technology. The CFSA incorporates isolated DL current sensing approach which provides the higher Current Ratio Amplification (CRA) factor. The CF-SA significantly outperforms with 66.89% and 31.47% lower sensing delay than CCSA [13] and HSA [8] respectively under similar ICell and bit-line and data-line capacitance. Our results show that even at the worst corner the CF-SA demonstrates 2.15x and 3.02x higher differential current and 2.23x and 1.7x higher data-line differential voltage with 66.6% and 34.32% higher mean (μ) than those of the best prior arts. Furthermore, failure probability of the proposed design against process parameter variations is rigorously analyzed through Monte Carlo simulations.
基于FinFET的小单元SRAM数据隔离差分电流输入/模式检测放大器
本文首次提出了一种新颖的、高性能的、鲁棒的电流馈电放大器(CF-SA)设计,用于20nm鳍形场效应晶体管(FinFET)技术的小型ICell SRAM。该CFSA采用隔离的DL电流传感方法,提供更高的电流比放大(CRA)因子。在相似的ICell、位线和数据线电容下,CF-SA的传感延迟分别比CCSA[13]和HSA[8]低66.89%和31.47%。结果表明,即使在最坏的角处,CF-SA的差分电流也比现有最佳技术高出2.15倍和3.02倍,数据线差分电压高出2.23倍和1.7倍,平均值(μ)分别高出66.6%和34.32%。此外,通过蒙特卡罗仿真严格分析了工艺参数变化对设计失效概率的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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