{"title":"Proton displacement damage in optocouplers","authors":"M. d'Ordine","doi":"10.1109/REDW.1997.629810","DOIUrl":null,"url":null,"abstract":"Proton testing has been performed on an optocoupler and a slotted optical switch. Test samples were biased while being irradiated to include total ionizing dose effects as well as displacement damage.","PeriodicalId":328522,"journal":{"name":"1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference","volume":"310 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-07-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"26","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 IEEE Radiation Effects Data Workshop NSREC Snowmass 1997. Workshop Record Held in conjunction with IEEE Nuclear and Space Radiation Effects Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/REDW.1997.629810","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 26
Abstract
Proton testing has been performed on an optocoupler and a slotted optical switch. Test samples were biased while being irradiated to include total ionizing dose effects as well as displacement damage.