Signal propagation over perforated reference planes

L. Shan, M. Ritter, A. Haridass, R. Weekly, D. Becker, E. Klink
{"title":"Signal propagation over perforated reference planes","authors":"L. Shan, M. Ritter, A. Haridass, R. Weekly, D. Becker, E. Klink","doi":"10.1109/SPI.2007.4512222","DOIUrl":null,"url":null,"abstract":"Voids on reference planes are commonly seen in organic chip packages and printed circuit boards. In this paper, the effects of these voids on the signal integrity of a high-density data bus will be studied. A generic FCPBGA chip package is used to illustrate the signal integrity concerns and perform sensitivity analysis on the key mechanisms including void size, adjacent plane interactions, and adjacent signal line interactions. The results show that proper design can mitigate the signal integrity impact of reference plane voids.","PeriodicalId":206352,"journal":{"name":"2007 IEEE Workshop on Signal Propagation on Interconnects","volume":"42 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2007-05-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"6","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2007 IEEE Workshop on Signal Propagation on Interconnects","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/SPI.2007.4512222","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 6

Abstract

Voids on reference planes are commonly seen in organic chip packages and printed circuit boards. In this paper, the effects of these voids on the signal integrity of a high-density data bus will be studied. A generic FCPBGA chip package is used to illustrate the signal integrity concerns and perform sensitivity analysis on the key mechanisms including void size, adjacent plane interactions, and adjacent signal line interactions. The results show that proper design can mitigate the signal integrity impact of reference plane voids.
信号在穿孔参考平面上的传播
参考平面上的空洞常见于有机芯片封装和印刷电路板。本文将研究这些空隙对高密度数据总线信号完整性的影响。使用通用的FCPBGA芯片封装来说明信号完整性问题,并对关键机制进行灵敏度分析,包括空隙尺寸,相邻平面相互作用和相邻信号线相互作用。结果表明,合理的设计可以减轻参考平面空隙对信号完整性的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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