Single crystal growth and structural characterization of Bi1.8Sb0.2Te1.5Se1.5 (BSTS) single crystal

Abstract

We report the single crystal growth and X-ray diffraction characterization of bulk Bi1.8Sb0.2Te1.5Se1.5 single crystals. Single crystal of Bi1.8Sb0.2Te1.5Se1.5 was grown by modified Bridgman method. The diffraction peaks corresponding to {0, 0, 3} planes reveal the growth of crystal along the c-direction. Analysis of X-ray diffraction pattern using Rietveld refinement verifies the phase purity, and confirms rhombohedral structure with R-3m space group.