Proceedings 20th IEEE VLSI Test Symposium (VTS 2002)

Abstract

The following topics are dealt with: microprocessor test; very low voltage testing; DFT testers; test set compression techniques; analog BIST; slow speed testing; test automation; scan-based testing; burn-in reduction; test power; fault diagnosis; analog circuit testing; high level test techniques; SoC test; supply current testing; IEEE P1500; test pattern generation; tester hardware modelling; FPGA test; fault modeling; memory testing; test-cost reduction; and oscillation based test.