TDD: a technology dependent decomposition algorithm for LUT-based FPGAs

A. Farrahi, M. Sarrafzadeh
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引用次数: 1

Abstract

A major drawback of the previous algorithms that perform decomposition and covering for LUT-based FPGA technology mapping is the lack of a fast, and reasonably accurate evaluation scheme for the decomposition phase. In this paper, we will show how a fast covering algorithm can be used as an evaluation engine for the decomposition phase. We show that decomposition has a significant impact on the quality of the final mapping result. More specifically, we show that starting from the same circuit topology, a blind decomposition leads to mapping results that use an average of 70 to 150% more LUTs compared to the results obtained using a technology driven decomposition algorithm. A technology driven decomposition algorithm is developed based on the proposed idea. Experiments on a number of MCNC benchmark circuits show an average of 12% to 72% improvement on the number of LUTs compared to the previously reported results.
TDD:基于lut的fpga的技术相关分解算法
先前执行分解和覆盖基于lut的FPGA技术映射的算法的一个主要缺点是缺乏分解阶段的快速且合理准确的评估方案。在本文中,我们将展示如何使用快速覆盖算法作为分解阶段的评估引擎。我们表明,分解对最终映射结果的质量有显著的影响。更具体地说,我们表明,从相同的电路拓扑开始,与使用技术驱动的分解算法获得的结果相比,盲分解导致的映射结果平均使用70到150%的lut。在此基础上,提出了一种技术驱动的分解算法。在许多MCNC基准电路上的实验表明,与先前报道的结果相比,lut数量平均提高了12%至72%。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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