{"title":"DSP architectures, algorithms, and code-generation: fission or fusion?","authors":"R. Simar","doi":"10.1109/ICISS.1997.630264","DOIUrl":null,"url":null,"abstract":"Continuing dramatic improvements in semiconductor manufacturing processes are enabling radical new signal-processing architectures at the chip level. The development of these new architectures must be coupled, a fusion, with clearly defined target applications, a thorough analysis of applicable signal processing algorithms, and significant advancements in code-generation technology. The TMS320C6x development program involved the codevelopment of the VelociTI architecture, a new code-generation environment, and a large set of representative benchmarks.","PeriodicalId":357602,"journal":{"name":"1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1997-10-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1997 Proceedings Second Annual IEEE International Conference on Innovative Systems in Silicon","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICISS.1997.630264","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5
Abstract
Continuing dramatic improvements in semiconductor manufacturing processes are enabling radical new signal-processing architectures at the chip level. The development of these new architectures must be coupled, a fusion, with clearly defined target applications, a thorough analysis of applicable signal processing algorithms, and significant advancements in code-generation technology. The TMS320C6x development program involved the codevelopment of the VelociTI architecture, a new code-generation environment, and a large set of representative benchmarks.