Intermittent operating life results for different control strategies

2015 16th International Conference on Electronic Packaging Technology (ICEPT) Pub Date : 2015-09-03 DOI:10.1109/ICEPT.2015.7236837

Yuan Chen, Bo Hou

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引用次数: 1

Abstract

Intermittent operating life test is an important method to characterize the lifetime and package reliability of power semiconductor devices. The control strategy is a very important feature of the intermittent operating life test. Intermittent operating life tests with identical start condition but different control strategies (temperature control strategy and time control strategy) have been performed, which have been conducted on specially assembled test equipment with ultimate control of all test parameters. The test results under these two different control strategies are analyzed and discussed. Failure analysis is also used, to understand the failure mechanisms induced by intermittent operating life tests. The changes of thermal resistance with intermittent life cycle number are compared under two control strategies. The results show, that time control strategy is more severe than temperature control strategy. The lifetime of power devices is longer under temperature control strategy. And the thermal resistance increases relatively larger by time control strategy.

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不同控制策略导致间歇运行寿命

间歇工作寿命试验是表征功率半导体器件寿命和封装可靠性的重要方法。控制策略是间歇工作寿命试验的一个重要特征。在专门装配的试验设备上进行了起动条件相同但控制策略(温度控制策略和时间控制策略)不同的间歇运行寿命试验，并对所有试验参数进行了最终控制。对两种不同控制策略下的试验结果进行了分析和讨论。失效分析也被用于了解由间歇运行寿命试验引起的失效机制。比较了两种控制策略下热阻随间歇生命周期数的变化。结果表明，时间控制策略比温度控制策略更严格。采用温度控制策略的功率器件寿命更长。采用时间控制策略时，热阻增大较大。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

2015 16th International Conference on Electronic Packaging Technology (ICEPT)

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