Theoretical total harmonic distortion evaluation based on digital to analogue converter mismatch to improve the linearity of successive approximation register analogue to digital converter

IF 1 4区 工程技术 Q4 ENGINEERING, ELECTRICAL & ELECTRONIC
Li Dong, Yan Song, Bing Zhang, Zhechong Lan, Youze Xin, Liheng Liu, Ken Li, Xiaofei Wang, Li Geng
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引用次数: 1

Abstract

Mismatch in the binary-weighted capacitive digital-to-analog converter (DAC) greatly affects the linearity of the successive-approximation-register (SAR) ADC by deteriorating the total harmonic distortion (THD). In this study, a theoretical relationship between the THD and the mismatch error of DAC array in SAR ADC is derived through discrete Fourier transform (DFT) analysis of the time-based integral error (TIE) of the ADC's output codes, which has no specific requirement on the type of the input signals. Guided by the theoretical THD expression, the trade-off among the linearity, design complexity, power consumption and chip area can be balanced easily. The presented formula is verified by a design example of 12-bit SAR ADC with dynamic-element-matching (DEM) technique, where the 3-bit LSBs from the SAR ADC are used to generate the randomised DEM state according to the previous THD evaluation. The linearity is enhanced by 9 dB approximately with very low hardware complexity and extremely small extra power consumption of 2 μW.

Abstract Image

基于数模转换器失配的理论总谐波失真评估,以提高逐次逼近寄存器模拟数字转换器的线性度
二值加权电容式数模转换器(DAC)的失配严重影响了连续逼近寄存器(SAR) ADC的线性度,导致总谐波失真(THD)恶化。本研究通过对ADC输出码的时基积分误差(TIE)进行离散傅立叶变换(DFT)分析,推导出SAR ADC中THD与DAC阵列失配误差之间的理论关系,该关系对输入信号的类型没有具体要求。在理论THD表达式的指导下,可以很容易地平衡线性度、设计复杂性、功耗和芯片面积之间的权衡。通过采用动态单元匹配(DEM)技术的12位SAR ADC设计实例验证了该公式,其中使用来自SAR ADC的3位lsb根据先前的THD评估生成随机化DEM状态。线性度提高约9db,硬件复杂度极低,额外功耗极低,仅为2 μW。
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来源期刊
Iet Circuits Devices & Systems
Iet Circuits Devices & Systems 工程技术-工程:电子与电气
CiteScore
3.80
自引率
7.70%
发文量
32
审稿时长
3 months
期刊介绍: IET Circuits, Devices & Systems covers the following topics: Circuit theory and design, circuit analysis and simulation, computer aided design Filters (analogue and switched capacitor) Circuit implementations, cells and architectures for integration including VLSI Testability, fault tolerant design, minimisation of circuits and CAD for VLSI Novel or improved electronic devices for both traditional and emerging technologies including nanoelectronics and MEMs Device and process characterisation, device parameter extraction schemes Mathematics of circuits and systems theory Test and measurement techniques involving electronic circuits, circuits for industrial applications, sensors and transducers
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