Benchmark Runs of the Subscripted D-Algorithm with Observation Path Mergers on the Brglez-Fujiwara Circuits

Abstract

To speed up the test generation process, the Subscripted D-Algorithm (AALG) uses "gang" testing in its attempts to construct a single test pattern designed to test simultaneously as many faults as possible. Other techniques such as merger of the observation paths and multiple backtrace are also introduced. However, the main purpose of this paper is to report results of the runs of AALG on various benchmark circuits specifically the Brglez-Fujiwara Circuits.