Theoretical Prediction on Temperature Dependence of Diffusion Coefficient of Various SiC Nanowires

Y. Omura
{"title":"Theoretical Prediction on Temperature Dependence of Diffusion Coefficient of Various SiC Nanowires","authors":"Y. Omura","doi":"10.1109/WOLTE55422.2022.9882545","DOIUrl":null,"url":null,"abstract":"This study theoretically predicts the diffusion coefficient (DSiC) of three-different SiC nanowires (3C-SiC, 4H-SiC, and 6H-SiC). A statistical mechanics based theoretical model is shown that can calculate the diffusion coefficient. Since the primary part of the model is based on Boltzmann’s statistics, the calculations are performed for temperatures higher than 100 K. It is strongly suggested that the crystalline structure influences diffusion coefficient characteristics, and that the multi-band transport should be taken into account in order to properly evaluate the diffusion coefficient. The diffusion coefficient of 4H-SiC wires is not sensitive to temperature, as well as wire width at low temperatures. These characteristics are compared with those of 3C-SiC, 6H-SiC, Ge and Si wires. Detailed discussed show how the crystalline structure and the energy band structure influence the characteristics of the diffusion coefficient.","PeriodicalId":299229,"journal":{"name":"2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE)","volume":"102 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-06-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 15th Workshop on Low Temperature Electronics (WOLTE)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WOLTE55422.2022.9882545","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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Abstract

This study theoretically predicts the diffusion coefficient (DSiC) of three-different SiC nanowires (3C-SiC, 4H-SiC, and 6H-SiC). A statistical mechanics based theoretical model is shown that can calculate the diffusion coefficient. Since the primary part of the model is based on Boltzmann’s statistics, the calculations are performed for temperatures higher than 100 K. It is strongly suggested that the crystalline structure influences diffusion coefficient characteristics, and that the multi-band transport should be taken into account in order to properly evaluate the diffusion coefficient. The diffusion coefficient of 4H-SiC wires is not sensitive to temperature, as well as wire width at low temperatures. These characteristics are compared with those of 3C-SiC, 6H-SiC, Ge and Si wires. Detailed discussed show how the crystalline structure and the energy band structure influence the characteristics of the diffusion coefficient.
不同SiC纳米线扩散系数温度依赖性的理论预测
本研究从理论上预测了三种不同SiC纳米线(3C-SiC、4H-SiC和6H-SiC)的扩散系数(DSiC)。提出了一种基于统计力学的理论模型来计算扩散系数。由于该模型的主要部分是基于玻尔兹曼统计,因此计算是在高于100 K的温度下进行的。结果表明,晶体结构对扩散系数特性有影响,为了正确评价扩散系数,应考虑多波段输运。4H-SiC丝的扩散系数对温度不敏感,低温时对丝宽也不敏感。这些特性与3C-SiC、6H-SiC、Ge和Si线进行了比较。详细讨论了晶体结构和能带结构对扩散系数特性的影响。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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