A Timing-Driven Algorithm for Leakage Reduction in MTCMOS FPGAs

Hassan Hassan, M. Anis, M. Elmasry
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引用次数: 5

Abstract

A timing-driven MTCMOS (T-MTCMOS) CAD methodology is proposed for subthreshold leakage power reduction in nanometer FPGAs. The methodology uses the circuit timing information to tune the performance penalty due to sleep transistors according to the path delays, achieving an average leakage reduction of 44.36 % when applied to FPGA benchmarks using a CMOS 0.13mum process. Moreover, the methodology is applied to several FPGA architectures and CMOS technologies.
一种MTCMOS fpga中减少漏损的时序驱动算法
提出了一种时序驱动MTCMOS (T-MTCMOS) CAD方法,用于降低纳米fpga的亚阈值泄漏功率。该方法使用电路定时信息根据路径延迟调整由于休眠晶体管造成的性能损失,当使用CMOS 0.13mum工艺应用于FPGA基准测试时,平均泄漏减少44.36%。此外,该方法还应用于几种FPGA架构和CMOS技术。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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