The world's first high voltage GaN-on-diamond power devices

Turar Baltynov, V. Unni, E. Narayanan
{"title":"The world's first high voltage GaN-on-diamond power devices","authors":"Turar Baltynov, V. Unni, E. Narayanan","doi":"10.1109/ESSDERC.2015.7324729","DOIUrl":null,"url":null,"abstract":"This paper reports the fabrication method and electrical characterization results of the first-ever demonstrated high voltage AlGaN/GaN HEMTs on CVD diamond substrate. Fabricated circular GaN-on-Diamond HEMTs with gate-to-drain drift length of 17 μm and source field plate length of 3 μm show an off-state breakdown voltage of ~ 1100V. Temperature characterization of Capacitance voltage characteristics provides insight on the temperature dependence of VTH and 2DEG sheet carrier concentration in the fabricated devices.","PeriodicalId":332857,"journal":{"name":"2015 45th European Solid State Device Research Conference (ESSDERC)","volume":"254 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2015-11-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"5","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2015 45th European Solid State Device Research Conference (ESSDERC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ESSDERC.2015.7324729","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 5

Abstract

This paper reports the fabrication method and electrical characterization results of the first-ever demonstrated high voltage AlGaN/GaN HEMTs on CVD diamond substrate. Fabricated circular GaN-on-Diamond HEMTs with gate-to-drain drift length of 17 μm and source field plate length of 3 μm show an off-state breakdown voltage of ~ 1100V. Temperature characterization of Capacitance voltage characteristics provides insight on the temperature dependence of VTH and 2DEG sheet carrier concentration in the fabricated devices.
世界上第一个高压GaN-on-diamond功率器件
本文报道了首次在CVD金刚石衬底上制备高压AlGaN/GaN hemt的方法和电学表征结果。制备的栅极-漏极漂移长度为17 μm,源场极板长度为3 μm的圆形gan -on-金刚石hemt的失态击穿电压为~ 1100V。电容电压特性的温度表征提供了对VTH和2DEG载流子浓度在制造器件中的温度依赖性的见解。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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