A CMOS eddy current sensor for microsystems

Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474) Pub Date : 2000-03-15 DOI:10.1109/ICCDCS.2000.869859

J. Gómez, D. Estève, J. Simonne

引用次数: 3

Abstract

This papers reports our contribution to the design of an eddy current sensor. The objective of this study is to conceive an Eddy current electromagnetic sensor in the area of the Nondestructive Testing. The sensor is integrated in a CMOS technology with an operational amplifier in the same substrate. A microsystem integrates the CMOS eddy current sensor that is used to detect cracks and irregularities of metallic targets to make a fast and reliable internal inspection.

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微系统CMOS涡流传感器

本文报道了我们对涡流传感器设计的贡献。本研究的目的是构想一种用于无损检测领域的涡流电磁传感器。该传感器集成在CMOS技术中，在同一衬底上有一个运算放大器。微系统集成了CMOS涡流传感器，用于检测金属目标的裂纹和不规则性，以进行快速可靠的内部检查。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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来源期刊

Proceedings of the 2000 Third IEEE International Caracas Conference on Devices, Circuits and Systems (Cat. No.00TH8474)

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