Yoshinori Matsuura, T. Yoshida, Yukiko Komiya, Toshimi Nakamura, Takenori Yanai, Kazuhiro Okuyama, Kyohei Kuwahara, Yukiko Kitabatake, Rintaro Ishii, Katsuyuki Hayashi, Takashi Kubota, Joji Fujii, V. B. Dutta
{"title":"Introducing novel “Rigid Carrier with Composite Release Layer” to assemble ultra-high density Advanced Packages & Substrates in wafer and panel format","authors":"Yoshinori Matsuura, T. Yoshida, Yukiko Komiya, Toshimi Nakamura, Takenori Yanai, Kazuhiro Okuyama, Kyohei Kuwahara, Yukiko Kitabatake, Rintaro Ishii, Katsuyuki Hayashi, Takashi Kubota, Joji Fujii, V. B. Dutta","doi":"10.1109/EPTC56328.2022.10013258","DOIUrl":null,"url":null,"abstract":"Rigid carrier substrates are essential to support assembly of advanced ultra-thin high-density packages and modules on wafer and panel format. An organic bonding-debonding layer is applied on the carrier which remains all through assembly and detached/released once package assembly is completed. Today borosilicate glass is used as carrier material. With the need for advanced package architecture, the organic bonding/debonding materials have reached their limits, with process and yield related issues. Further, besides the restriction to use high-cost borosilicate glass as carrier material, there are several other technical issues associated with organic bonding-debonding release material. In this paper these details have been discussed and an alternate material set is described. A new “Rigid carrier with composite inorganic release layer” is introduced. It overcomes the current assembly issues along with the opportunity to reduce total manufacturing cost, with availability of several low-cost rigid substrate carrier materials. This novel material set is referred as HRDP® (High Resolution Debondable Panel) and is available in large size wafer and panel formats. The HRDP serves as a drop-in solution to existing assembly flow. This paper describes the new material set, process details to achieve ultra-fine line/space (<1um), impact on warpage and debonding release force, chemical and thermal resistance results as well as cost comparison data.","PeriodicalId":163034,"journal":{"name":"2022 IEEE 24th Electronics Packaging Technology Conference (EPTC)","volume":"29 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-12-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE 24th Electronics Packaging Technology Conference (EPTC)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC56328.2022.10013258","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
Rigid carrier substrates are essential to support assembly of advanced ultra-thin high-density packages and modules on wafer and panel format. An organic bonding-debonding layer is applied on the carrier which remains all through assembly and detached/released once package assembly is completed. Today borosilicate glass is used as carrier material. With the need for advanced package architecture, the organic bonding/debonding materials have reached their limits, with process and yield related issues. Further, besides the restriction to use high-cost borosilicate glass as carrier material, there are several other technical issues associated with organic bonding-debonding release material. In this paper these details have been discussed and an alternate material set is described. A new “Rigid carrier with composite inorganic release layer” is introduced. It overcomes the current assembly issues along with the opportunity to reduce total manufacturing cost, with availability of several low-cost rigid substrate carrier materials. This novel material set is referred as HRDP® (High Resolution Debondable Panel) and is available in large size wafer and panel formats. The HRDP serves as a drop-in solution to existing assembly flow. This paper describes the new material set, process details to achieve ultra-fine line/space (<1um), impact on warpage and debonding release force, chemical and thermal resistance results as well as cost comparison data.