Influence of the oscillation frequency value on the efficiency of oscillation-based tests

Abstract

The main goal of this paper is investigation of the fault coverage dependence on the value of the oscillation frequency in oscillation-based tests of analog circuits. For this purpose, an operational amplifier designed in 90 nm CMOS technology was used as a Circuit Under Test (CUT) in our experiment. Then, the CUT was transformed into an oscillator and different catastrophic faults were considered. The achieved experimental results show that selection of the appropriate value of the oscillation frequency might considerable increase the detectability of selected hard-detectable faults.