Multilevel finite difference methods for the characterization of substrate coupling in deep sub-micron designs

Abstract

Accurate modeling of noise coupling effects due to crosstalk via the substrate is an increasingly important concern for the design and verification of analog, digital and mixed analog-digital systems. In this paper we present a technique for model characterization that is based on a finite difference formulation whose solution is accelerated by means of a multilevel method. This technique can be used for accurate and efficient extraction of substrate coupling parameters in deep sub-micron designs.