Coordinate sensitive photodetectors based on InGaAs/InP heterostructures

ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386) Pub Date : 2000-10-16 DOI:10.1109/ASDAM.2000.889531

E. Budeanu, I. Grozescu, M. Purica, E. Rusu, S. V. Slobodchikov

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Abstract

The dependence of the longitudinal photo-e.m.f. in In/sub 0.53/Ga/sub 0.47/As p-n junctions on the coordinate x of the light spot and temperature has been investigated. A linear dependence V/sub phl/=f(x) has been observed and the V/sub phl/ temperature dependence in the 100-300 K range is determined by the carrier mobility change. A quadrant p-i-n photodiode based on an InP/InGaAs/InP heterostructure was fabricated and its electrical characteristics studied. The photodetector shows wide spectral characteristics (0.9-1.7 /spl mu/m) with a responsivity of each element of 0.62 A/W and a slope of the inversion characteristics of K=(0.8-1.0) 10/sup 3/ V/W.mm.

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基于InGaAs/InP异质结构的坐标灵敏光电探测器

纵向光电动势的依赖性。在in /sub 0.53/Ga/sub 0.47/As中研究了p-n结在x坐标上的光斑和温度。在100-300 K范围内，V/sub phl/=f(x)呈线性关系，V/sub phl/温度依赖性由载流子迁移率变化决定。制作了一种基于InP/InGaAs/InP异质结构的象限p-i-n光电二极管，并对其电学特性进行了研究。光电探测器具有宽光谱特性(0.9 ~ 1.7 /spl mu/m)，各元素的响应度为0.62 a /W，反演特性斜率K=(0.8 ~ 1.0) 10/sup 3/ V/W.mm。

本文章由计算机程序翻译，如有差异，请以英文原文为准。

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ASDAM 2000. Conference Proceedings. Third International EuroConference on Advanced Semiconductor Devices and Microsystems (Cat. No.00EX386)

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