9.74-THz electronic Far-Infrared detection using Schottky barrier diodes in CMOS

Z. Ahmad, A. Lisauskas, H. Roskos, K. O. Kenneth
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引用次数: 25

Abstract

9.74-THz fundamental electronic detection of Far-Infrared (FIR) radiation is demonstrated. The detection along with that at 4.92THz was realized using Schottky-barrier diode detection structures formed without any process modifications in CMOS. Peak optical responsivity (Rv) of 383 and ~14V/W at 4.92 and 9.74THz have been measured. The Rv at 9.74THz is 14X of that for the previously reported highest frequency electronic detection. The shot noise limited NEP at 4.92 and 9.74THz is ~0.43 and ~2nW/√Hz, respectively.
在CMOS中使用肖特基势垒二极管的9.74太赫兹电子远红外探测
演示了9.74太赫兹远红外(FIR)辐射的基本电子探测。4.92THz和4.92THz的检测都是利用在CMOS中形成的肖特基势垒二极管检测结构实现的,没有任何工艺修改。在4.92 thz和9.74THz下测得峰值光响应度分别为383和~14V/W。9.74THz的Rv是先前报道的最高频率电子探测的14倍。在4.92 thz和9.74THz处,弹丸噪声限制NEP分别为~0.43和~2nW/√Hz。
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