Special session 12A: Hot topic counterfeit IC identification: How can test help?

Abstract

Integrated circuit counterfeiting is a severe challenge for semiconductor companies, system integrators and product end-users. Substantial revenue losses by individual enterprises as well as detrimental economy-wide effects have triggered significant interest in counterfeit detection and prevention by commercial actors and governments. This resulted in a number of large-scale research initiatives and networks that focus on this topic, in North America, Europe and elsewhere. The hot-topic special session will introduce the test community to counterfeit detection techniques and identify open problems which can be solved using tools and methods from the testing area.