Fabrics on Die: Where Function, Debug and Test Meet

Abstract

In this paper, we briefly present how packet-based networks or fabrics, have found their way into diverse usages on high-end industrial designs today. We outline the salient features, use models and challenges involved in implementation and application of these fabrics, not only in functional communication but also in power-management, silicon debug and high-volume-manufacturing test. Both debug and test hooks in SOC/NOC and some test/debug scenarios are discussed. We touch on some recent advances in functional networks and their implications to debug & test.