Review of fault injection mechanisms and consequences on countermeasures design

J. Dutertre, J. Fournier, A. Mirbaha, D. Naccache, J. Rigaud, B. Robisson, A. Tria
{"title":"Review of fault injection mechanisms and consequences on countermeasures design","authors":"J. Dutertre, J. Fournier, A. Mirbaha, D. Naccache, J. Rigaud, B. Robisson, A. Tria","doi":"10.1109/DTIS.2011.5941421","DOIUrl":null,"url":null,"abstract":"The secret keys handled by cryptographic devices can be extracted using fault attacks associated with cryptanalysis techniques. These faults can be induced by different means such as laser exposure, voltage or clock glitches, electromagnetic perturbation, etc. This paper provides a detailed insight into the physics and mechanisms involved in several fault injection processes. The paper also highlights the difficulty to design countermeasures while even hardware duplication, usually considered as secure, has proved to show flaws against low cost fault injection means.","PeriodicalId":409387,"journal":{"name":"2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2011-04-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"21","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2011 6th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/DTIS.2011.5941421","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 21

Abstract

The secret keys handled by cryptographic devices can be extracted using fault attacks associated with cryptanalysis techniques. These faults can be induced by different means such as laser exposure, voltage or clock glitches, electromagnetic perturbation, etc. This paper provides a detailed insight into the physics and mechanisms involved in several fault injection processes. The paper also highlights the difficulty to design countermeasures while even hardware duplication, usually considered as secure, has proved to show flaws against low cost fault injection means.
故障注入机制及其对对策设计的影响
可以使用与密码分析技术相关联的错误攻击提取加密设备处理的密钥。这些故障可以通过不同的方式引起,如激光照射、电压或时钟故障、电磁扰动等。本文详细介绍了几种断层注入过程的物理和机制。本文还强调了设计对策的难度,而即使是通常被认为是安全的硬件复制,也已被证明在低成本的故障注入手段面前存在缺陷。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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