{"title":"Phenomenological approach for ESD immunity design","authors":"W. Rhoades","doi":"10.1109/ISEMC.1994.385660","DOIUrl":null,"url":null,"abstract":"It is verified that, a 330 ohm/l50 pF ESD contact discharge simulator met the IEC 801-2 requirements in 150 ps and 350 ps rise time test setups. This same ESD simulator using air discharge in a 150 ps test setup, with a charge voltage, between 2 and 8 kV had a peak current 2 times higher and a rise time of 1/6 of the contact values. A five step design order is presented to achieve cost effective ESD equipment immunity design. The key consideration for obtaining this design is the understanding of the common-mode (CM) ESD current path. A number of examples illustrate this key from the simple reset hardening to the advance concept of ESD differential termination of the converted transient and using a CM inductor to improve the CM rejection in the receptor.<<ETX>>","PeriodicalId":154914,"journal":{"name":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","volume":"22 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1994-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of IEEE Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ISEMC.1994.385660","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
It is verified that, a 330 ohm/l50 pF ESD contact discharge simulator met the IEC 801-2 requirements in 150 ps and 350 ps rise time test setups. This same ESD simulator using air discharge in a 150 ps test setup, with a charge voltage, between 2 and 8 kV had a peak current 2 times higher and a rise time of 1/6 of the contact values. A five step design order is presented to achieve cost effective ESD equipment immunity design. The key consideration for obtaining this design is the understanding of the common-mode (CM) ESD current path. A number of examples illustrate this key from the simple reset hardening to the advance concept of ESD differential termination of the converted transient and using a CM inductor to improve the CM rejection in the receptor.<>