P. Hashemi, J. Yau, Kevin K. H. Chan, T. Ning, G. Shahidi
{"title":"First demonstration of symmetric lateral NPN transistors on SOI featuring epitaxially-grown emitter/collector regions","authors":"P. Hashemi, J. Yau, Kevin K. H. Chan, T. Ning, G. Shahidi","doi":"10.1109/S3S.2017.8309229","DOIUrl":null,"url":null,"abstract":"We report the first demonstration of symmetric lateral NPN transistors on SOI having epitaxially-grown emitter/collector (E/C). Employing a novel notch-assisted epitaxy scheme, using faceted Si epi as RIE mask to expose the vertical intrinsic-base epi-seeding surfaces, the epitaxial E/C are automatically connected to extension regions for metal contact and/or for electrical probing. Healthy device I-V characteristics were obtained with post-epi RTA. The results suggest a path forward for devices suitable for low-power THz electronics applications.","PeriodicalId":333587,"journal":{"name":"2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)","volume":"51 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2017-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2017 IEEE SOI-3D-Subthreshold Microelectronics Technology Unified Conference (S3S)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/S3S.2017.8309229","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 1
Abstract
We report the first demonstration of symmetric lateral NPN transistors on SOI having epitaxially-grown emitter/collector (E/C). Employing a novel notch-assisted epitaxy scheme, using faceted Si epi as RIE mask to expose the vertical intrinsic-base epi-seeding surfaces, the epitaxial E/C are automatically connected to extension regions for metal contact and/or for electrical probing. Healthy device I-V characteristics were obtained with post-epi RTA. The results suggest a path forward for devices suitable for low-power THz electronics applications.