EMI coupling paths in silicon optical sub-assembly package

Jing Li, Xiao Li, Xiangyang Jiao, Sukhjinder Toor, Ling Zhang, A. Bhobe, J. Drewniak, D. Pommerenke
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引用次数: 9

Abstract

Optical transceiver modules are commonly used in telecommunication and data communications systems. These modules, which are located in the optical I/O ports at the front-end of switches and routers, are a dominating source of electromagnetic interference (EMI) problems at their operation frequency and/or harmonics. In this study, a simulation model is used to investigate the EMI coupling physics and performance of the silicon optical sub-assembly (OSA) module. Total radiation power (TRP) measurement has also been performed in a mode-stirred reverberation chamber (RC) to support the radiation mechanism analysis. The connector between the module circuit board to flex cable has been identified as the major EMI source above 15 GHz in the OSA module. This conclusion can help provide insight to EMC design engineers about the potential EMI problems in the OSA package.
硅光学子组件封装中的电磁干扰耦合路径
光模块是电信和数据通信系统中常用的模块。这些模块位于交换机和路由器前端的光I/O端口,是其工作频率和/或谐波的电磁干扰(EMI)问题的主要来源。本文采用仿真模型研究了硅光学子组件(OSA)模块的电磁干扰耦合物理特性和性能。在模搅拌混响室(RC)中进行了总辐射功率(TRP)测量,以支持辐射机理分析。模块电路板与柔性电缆之间的连接器已被确定为OSA模块中15ghz以上的主要EMI源。这一结论可以帮助EMC设计工程师了解OSA封装中潜在的EMI问题。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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