S. Baba, Y. Tomita, M. Matsuo, H. Matsushima, N. Ueda, O. Nakagawa
{"title":"Molded chip scale package for high pin count","authors":"S. Baba, Y. Tomita, M. Matsuo, H. Matsushima, N. Ueda, O. Nakagawa","doi":"10.1109/ECTC.1996.550895","DOIUrl":null,"url":null,"abstract":"A unique molded Chip Scale Package (CSP) associated 1024 pin counts has been developed. The design and process have been optimized in order to achieve high mount density, enhanced electrical characteristic and cost competitiveness. Also, the reliability testing was performed on thermal cycling and moisture induced crack resistivity. Finally, enhanced electrical and thermal characteristics were calculated.","PeriodicalId":143519,"journal":{"name":"1996 Proceedings 46th Electronic Components and Technology Conference","volume":"335 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1996-05-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"27","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"1996 Proceedings 46th Electronic Components and Technology Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ECTC.1996.550895","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 27
Abstract
A unique molded Chip Scale Package (CSP) associated 1024 pin counts has been developed. The design and process have been optimized in order to achieve high mount density, enhanced electrical characteristic and cost competitiveness. Also, the reliability testing was performed on thermal cycling and moisture induced crack resistivity. Finally, enhanced electrical and thermal characteristics were calculated.