NAND/NOR gate polymorphism in low temperature environment

R. Ruzicka, Václav Simek
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引用次数: 5

Abstract

The fundamental aspect behind this paper is focused on behaviour of polymorphic digital circuits in potentially harsh operating environment. The area of polymorphic electronics takes and an advantage of inherently built-in features that open up the possibility for on-the-fly adjustment of a particular circuit function with respect to the environment. The most prevalent benefit here is connected with the fact that space-efficient circuit implementation can be achieved due to the adoption of polymorphic principles and, thus, eliminate the need for an additional function change controller. The experimental setup was based around reconfigurable polymorphic chip REPOMO32, which is primarily designed to be configured (in addition to the configuration bit stream) by means of using the level of power supply voltage (Vdd), and carrier board with all necessary capabilities for temperature measurement up to -40C boundary and its response analysis. Experiments clearly indicate that polymorphic gates in the chip can be easily controlled not only by Vdd, but also by temperature. The obtained results also prove that the physical design of the REPOMO32 chip is robust enough under wide range f operating temperature.
低温环境下NAND/NOR门多态性研究
本文背后的基本方面是关注多态数字电路在潜在恶劣的工作环境中的行为。多态电子领域利用固有的内置功能,为根据环境动态调整特定电路功能开辟了可能性。这里最普遍的好处是,由于采用了多态原理,可以实现空间高效的电路实现,从而消除了对额外功能更改控制器的需求。实验设置基于可重构多态芯片REPOMO32,该芯片主要设计为通过使用电源电压(Vdd)水平和载波板进行配置(除了配置比特流外),并具有所有必要的温度测量功能,最高可达-40℃边界及其响应分析。实验清楚地表明,芯片中的多晶门不仅可以通过Vdd控制,而且可以通过温度控制。结果还证明了REPOMO32芯片的物理设计在较宽的工作温度范围下具有足够的鲁棒性。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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