Investigation of the piezoelectric properties of semiconducting nanostructures

Abstract

In this paper, the piezoelectric properties of semiconducting nano structures have been investigated. The piezoelectric effect can be characterized via a nano-scale material testing system that utilizing microelectromechanical systems technology. The coefficients were measured by applying a voltage (field) and measuring the induced elongation (strain). It can be readily seen that the piezoelectric effects in nanostructures are generally non-linear and the coefficient is much higher than that for bulk.