Simplified gate level noise injection models for behavioral noise coupling simulation

Abstract

In CMOS digital logic, there are two major noise sources requiring consideration. These are a circuit's power supply current and its noise current injected into the substrate of the circuit. This paper proposes a method for modeling and estimating the noise current injected into the substrate by capacitive coupling in digital circuits. The simplicity of the model and the reduction of details in the technology libraries facilitates behavioral level noise coupling simulation. The model is exemplified and evaluated for a simple NOT gate test case, for which the accuracy and simplicity of the models show great promise for simulation at the behavioral level.