{"title":"Computer aided reliability assessment","authors":"Ji Wu, M. Pecht, Jiaji Wang","doi":"10.1109/EPTC.2003.1298689","DOIUrl":null,"url":null,"abstract":"This paper describes the structure and operation of integrated software tools being developed at the CALCE Electronic Products and Systems Center which facilitate design-for-reliability and virtual qualification of electronic systems at the component and circuit card level.","PeriodicalId":201404,"journal":{"name":"Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003.","volume":"20 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fifth International Conference onElectronic Packaging Technology Proceedings, 2003. ICEPT2003.","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EPTC.2003.1298689","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper describes the structure and operation of integrated software tools being developed at the CALCE Electronic Products and Systems Center which facilitate design-for-reliability and virtual qualification of electronic systems at the component and circuit card level.