Low-power SRAM circuit design

M. Margala
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引用次数: 57

Abstract

This paper presents an extensive summary of the latest developments in low-power circuit techniques and methods for Static Random Access Memories. The key techniques in power reduction in both active and standby modes are: capacitance reduction by using divided word-line structure or single-bitline cross-point cell activation, pulse operation by using ATD generator and reduced signal swings on high-capacitance predecode lines, write bus lines and datalines, AC current reduction by using multistage decoding, operating voltage reduction coupled with low-power sensing by using charge-transfer amplification, step-down boosted word-line scheme or full current-mode read/write operation and leakage current suppression by using dual-Vt, Auto-Backgate-Controlled multiple-Vt, or dynamic leakage cut-off techniques.
低功耗SRAM电路设计
本文对静态随机存储器的低功耗电路技术和方法的最新进展进行了广泛的总结。在活动和待机模式下降低功耗的关键技术是:采用分字线结构或单位线交叉点单元激活来减小电容;采用ATD发生器进行脉冲操作并减小高电容前置线、写母线和数据线上的信号波动;采用多级解码来减小交流电流;降压增强字线方案或全电流模式读/写操作,并通过使用双电压、自动后门控制多电压或动态泄漏截止技术抑制泄漏电流。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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